19 lines
1.3 KiB
JSON
19 lines
1.3 KiB
JSON
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{
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"kind": "component-tests",
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"target": "esp32c5",
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"idf_version": "6.0.2",
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"port": "COM11",
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"status": "pass",
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"reset": "none",
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"checks": 503,
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"backend": "BackendMbedTls (PSA Crypto, mbedTLS 4.1.0 of ESP-IDF 6.0.2); 503 checks = the 629 host checks minus the OpenSSL-only oracle tests",
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"capture": "listen-only after the esptool post-flash reset; the boot banner precedes the first retained line",
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"resolves": "evidence/security-device-02 'OER decoding failed': device heap exhaustion in test_fail_closed (five concurrent test stations, ~25-45 kB each; 14 kB free when the asn1c copy failed). The test now scopes each scenario; the library was not changed. The board became unflashable after that failing run because the ROM UART0 clock-enable repair only ran inside the HIL server, which a failed test run never reaches; app_main now applies it first (COM20 still needs one boot into the ROM download mode by hand before it can be flashed again).",
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"sha256": {
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"application": "5fd4602978f12bf18ad9a19e88836ff066450a0359092efb4b865192b9632eb5",
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"bootloader": "93903cefa2bae3f5805a604ae744fabfdea78a866a1230ec3cc129190b93fe40",
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"partition_table": "73c0b5c3e5fcba3a151cc70c453c93dd5f4798899e7f2f8cca76da1f32ffc501",
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"sdkconfig": "caa03c6c8556d56b8ac848bc142ce68331b4a9cae3081590d4c7111338bc60a6"
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}
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}
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